| 摘要 |
<p>An apparatus for testing an electrical part having a number of conductive paths. The apparatus includes a mechanism (10) directing a laser pulse to impinge upon a conductor (14) of the part under test so as to form a metallic plasma and one or more pairs of probes (16) which, along with the conductor and the plasma, form a part of an electrical circuit. Finally, the apparatus includes a detector (18) which is responsive to the amount of conduction via the plasma between the conductor and the probes.</p> |
