发明名称 Dynamic random-access memory cell structure - has memory capacitors contained in etched channels in semiconductor surface with electrode structure supporting memory dielectric and counter-electrode
摘要 <p>The memory cell structure has a cell field formed in the surface of a semiconductor substrate (12, each cell having at least one selection transistor and a memory capacitor, contained in an etched channel. The electrode structure (21) of the memory capacitor contains at least 2 electrically coupled elements (15,17,20) at a given relative spacing, with a storage dielectric (22) and a counter-electrode (23) at the surface of the electrode structure.</p>
申请公布号 DE19526952(A1) 申请公布日期 1997.01.30
申请号 DE1995126952 申请日期 1995.07.24
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 WIDMANN, DIETRICH, DR.-ING., 82008 UNTERHACHING, DE;WENDT, HERMANN, DIPL.-PHYS. DR., 85630 GRASBRUNN, DE;HOENLEIN, WOLFGANG, DIPL.-PHYS. DR., 82008 UNTERHACHING, DE
分类号 H01L21/8242;(IPC1-7):H01L27/108;H01L21/824 主分类号 H01L21/8242
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