发明名称 |
Semiconductor integrated circuit for preventing deterioration of the characteristics of an N-channel type transistor |
摘要 |
In a semiconductor integrated circuit constructed by thin film transistors (TFTs), an invertor circuit or a NAND circuit is formed by arranging a transmission gate circuit, a P-channel type TFT or an N-channel type TFT between a circuit including at least one P-channel type TFT and a circuit including at least one N-channel type TFT. The N-channel type TFT is earthed. Voltage drop produces by the arranged transmission gate circuit or P-channel or N-channel type TFT, so that the drain voltage of the earthed N-channel type TFT is decreased and an electric field near the drain region of the N-channel type TFT is decreased.
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申请公布号 |
US5598106(A) |
申请公布日期 |
1997.01.28 |
申请号 |
US19950445412 |
申请日期 |
1995.05.19 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
KAWASAKI, YUJI;KOYAMA, JUN |
分类号 |
H01L21/8238;H01L27/08;H01L27/092;H01L29/78;H01L29/786;H03K17/10;H03K19/003;H03K19/0948;(IPC1-7):H03K17/10 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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