A bonded wafer (10) has a silicon device layer (20) bonded to a layer of semi-insulating material (14), preferably a mobility degraded silicon such as polycrystaline silicon. Layer (14) is thick enough and substrate (16) is conductive enough to reduce resistive losses when devices in layer (20) are operated at frequencies above 0.1 GHZ. Substrate (16) is conductive enough and semi-insulating material (14) is resistive enough to prevent cross-talk among devices in layer (20).
申请公布号
WO9702598(A1)
申请公布日期
1997.01.23
申请号
WO1996US11167
申请日期
1996.06.28
申请人
HARRIS CORPORATION
发明人
BEGLEY, PATRICK, A.;RIVOLI, ANTHONY;BAJOR, GYORGY;LOWTHER, REX, E.