发明名称 Process of reducing trace levels of metal impurities from resist components
摘要 <p>A process of reducing trace metal impurities from an impure resist component solution comprising the steps of: (1) forming an impure resist component solution containing trace amounts of dissolved metallic impurities, the resist component solvent selected from the group consisting of ethyl lactate, ethyl 3-ethoxypropionate, methyl 3-methoxypropionate, propylene glycol methyl ethyl acetate, or mixtures thereof; (2) contacting said impure resist component solution with a mixture of cyclohexane and isopropyl acetate and with an aqueous acidic solution for a sufficient amount of time to form a first two-phase reaction mixture comprising a first aqueous phase containing metallic impurities extracted from said impure resist component solution and a first organic phase containing said resist component solution with a reduced amount of trace metal impurities; (3) separating said first aqueous phase from said first organic phase; (4) contacting said first organic phase with a mixture of water and resist component solvent for a sufficient amount of time to form a second two-phase reaction mixture comprising a second aqueous phase containing metallic impurities extracted from said first organic phase and a second organic phase containing said resist component solution with further reduced amount of trace metal impurities; (5) separating said second aqueous phase from said second organic phase; and (6) removing said cyclohexane and said isopropyl acetate from said second organic phase, thereby forming a pure resist component solution.</p>
申请公布号 EP0754975(A2) 申请公布日期 1997.01.22
申请号 EP19960304951 申请日期 1996.07.04
申请人 OLIN CORPORATION 发明人 DAVIDSON, JAMES M.
分类号 B01D11/04;C08G8/08;G03F7/023;G03F7/26;H01L21/027;(IPC1-7):G03F7/004 主分类号 B01D11/04
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