| 摘要 |
In a semiconductor memory device, data required for controlling design margins and access time is stored at a selected fuse ROM array and a vendor test is performed. By using the information obtained by the vendor testing, fuse ROM arrays are programed, so that design margins and access time can be easily varied according to semiconductor memory device, thereby enhancing the device performance. Moreover, by additionally adapting a multiplexer, a plurality of fuse ROM arrays can be programmed by using a few pads.
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