发明名称 |
Optical detector for echelle spectrometer |
摘要 |
A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two-dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.
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申请公布号 |
US5596407(A) |
申请公布日期 |
1997.01.21 |
申请号 |
US19950477169 |
申请日期 |
1995.06.07 |
申请人 |
VARIAN ASSOCIATES, INC |
发明人 |
ZANDER, ANDREW T.;COOPER, III, CHARLES B.;CHIEN, RING-LING |
分类号 |
G01J3/18;G01J3/28;G01J3/36;(IPC1-7):G01J3/18 |
主分类号 |
G01J3/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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