MEASURING METHOD FOR FUNDAMENTAL FREQUENCY AND MEASURING DEVICE,申请号JP19950188659-传众专利搜索

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发明名称	MEASURING METHOD FOR FUNDAMENTAL FREQUENCY AND MEASURING DEVICE
摘要
申请公布号	JPH0915273(A)	申请公布日期	1997.01.17
申请号	JP19950188659	申请日期	1995.06.30
申请人	SONY TEKTRONIX CORP	发明人	OKI IWAO
分类号	G01R23/02;G01R23/16;(IPC1-7):G01R23/02	主分类号	G01R23/02
代理机构		代理人
主权项
地址

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