发明名称 UNIFORMITY OF COPPER ETCHING IN THE FABRICATION OF MULTILAYER PRINTED CIRCUIT BOARDS
摘要 This invention is a process for etching copper sheets on insulating boards for use in fabricating multilayer printed circuit boards. The improvementresides in adding to a standard copper etching solution certain alkyltrimethyl ammonium chlorides with alkyl chain lengths ranging from 6 to 20 carbon atoms inamounts sufficient to yield intermediate kinetics behavior. Of special interest are dodecyltrimethyl ammonium chloride, hexadecyltrimethyl ammonium chloride and octadecyltrimethyl ammonium chloride present in an amount of from 0.01 to 1.0 wt%. A silicon-based antiforming agent may be added in amounts of from 0.05 to 2.0wt. % to prevent an unacceptably large amount of foam from occurring during etching. With this formulation, the rate is mass transport controlled at low rates and almost independent of mass transport at high rates due to the inhibition of the surface reaction rate. As a result, non-uniformities in etch rates due to variations in mass transport conditions in processing equipment may be eliminated. This unique formulation could significantly improve the yields presently obtained in manufacturing as well as allow the processing of fine-line multilayer circuit boards.
申请公布号 CA2066947(C) 申请公布日期 1997.01.14
申请号 CA19922066947 申请日期 1992.04.23
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 LAL, SUDARSHAN;SMITH, CRAIG GORDON
分类号 C23F1/00;C23F1/18;H05K3/06;(IPC1-7):H05K3/06 主分类号 C23F1/00
代理机构 代理人
主权项
地址