发明名称 MOSFET & METHOD OF MANUFACTURING THE SAME
摘要 The present invention is to provide a method for fabricating MOSFET (metal oxide semiconductor field effect transistor) device using a trench. The method for fabricating MOSFET (metal oxide semiconductor field effect transistor) device using a trench according to the present invention comprises: a) forming a field oxide layer(12) for isolating devices on a P-type substrate(11); b) forming a gate oxide layer(14), a polysilicon layer(15) and a tungsten gate electrode(20) in this order on the trench(13); and c) forming a source(17) and drain(18) between the gate oxide layer(14) and the field oxide layer(12). Thereby the present invention provides the device with high performance and improved characteristic of step coverage due to planar structure.
申请公布号 KR970000463(B1) 申请公布日期 1997.01.11
申请号 KR19880014281 申请日期 1988.10.31
申请人 LG SEMICONDUCTOR CO.,LTD. 发明人 KIM, KI-HONG;HONG, KI-KAK
分类号 H01L29/00;H01L43/06;(IPC1-7):H01L29/00 主分类号 H01L29/00
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