发明名称 MANUFACTURE OF DRAM CELL IN WHICH HEMISPHERICAL GRAIN TYPE POLYSILICON AND SELECTIVE POLYSILICON ETCHBACK ARE USED
摘要 PROBLEM TO BE SOLVED: To increase the charge storing capacity of the memory cell, etc., of a DRAM. SOLUTION: A storage node 64 for capacitor having an increased charge storing capacity and its manufacturing method. A thin film layer 70 of hemispherical polysilicon is deposited on a doped polysilicon region 68. The doped polysilicon region 68 and hemispherical polysilicon thin film layer 70 are etched by using an etching compound which etches the area 68 faster than the layer 70 so as to increase the area of the upper surface 66 of the node.
申请公布号 JPH098250(A) 申请公布日期 1997.01.10
申请号 JP19960052074 申请日期 1996.03.08
申请人 TEXAS INSTR INC <TI> 发明人 DARIUSU ERU KURENSHIYOU;RITSUKU ERU WAIZU;JIEFURII MATSUKII
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
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