发明名称 EXTENDED SLOT TEST EQUIPMENT
摘要 PURPOSE: To improve the check (test) efficiency of an information processor. CONSTITUTION: An option card 10 executes the data read/write operation between a RAM 3 of an information device and a memory 15 of the card itself to test plural extended slots 7a to 7d provided in the information device and is provided with plural contact parts 11a to 11d set correspondingly to extended slots 7a to 7d, plural bus switches 13a to 13d provided for data busses 12 from contact parts 11a to 11d independently of one another, an extended slot I/F controller 14 which selects plural extended slots 7a to 7d in order one by one and controls data transfer between the RAM 3 and the memory 15, and a bus switch switching controller 16 which controls bus switches 13a to 13d of extended slots 7a to 7d successively selected by the extended slot I/F controller 14.
申请公布号 JPH096643(A) 申请公布日期 1997.01.10
申请号 JP19950155861 申请日期 1995.06.22
申请人 TOSHIBA CORP 发明人 FURUTA TETSUO
分类号 G06F3/00;G06F11/22 主分类号 G06F3/00
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