发明名称 |
BIPOLAR IC & METHOD OF MANUFACTURING THE SAME |
摘要 |
A fabrication method of high integration bipolar IC is provided to enhance the simplicity of processes by using an epitaxial growing. The fabrication method of bipolar IC includes the steps of: diffusing impurities of phosphorus in a n+ buried layer; removing a silicon oxide layer; forming P- epitaxial layer in a low concentration p-type substrate by epitaxial growing ; and epitaxial growing N- epitaxial layer implanted by boron impurities. The P- epitaxial layer has a thickness of 20 % relative to the thickness of the main N- epitaxial layer. Thereby, it is possible to decrease an auto doping due to out-diffusion of phosphorous impurities.
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申请公布号 |
KR970000464(B1) |
申请公布日期 |
1997.01.11 |
申请号 |
KR19880012695 |
申请日期 |
1988.09.30 |
申请人 |
LG SEMICONDUCTOR CO.,LTD. |
发明人 |
LEE, KYUNG-ILL |
分类号 |
H01L29/70;(IPC1-7):H01L29/70 |
主分类号 |
H01L29/70 |
代理机构 |
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代理人 |
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地址 |
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