发明名称 BIPOLAR IC & METHOD OF MANUFACTURING THE SAME
摘要 A fabrication method of high integration bipolar IC is provided to enhance the simplicity of processes by using an epitaxial growing. The fabrication method of bipolar IC includes the steps of: diffusing impurities of phosphorus in a n+ buried layer; removing a silicon oxide layer; forming P- epitaxial layer in a low concentration p-type substrate by epitaxial growing ; and epitaxial growing N- epitaxial layer implanted by boron impurities. The P- epitaxial layer has a thickness of 20 % relative to the thickness of the main N- epitaxial layer. Thereby, it is possible to decrease an auto doping due to out-diffusion of phosphorous impurities.
申请公布号 KR970000464(B1) 申请公布日期 1997.01.11
申请号 KR19880012695 申请日期 1988.09.30
申请人 LG SEMICONDUCTOR CO.,LTD. 发明人 LEE, KYUNG-ILL
分类号 H01L29/70;(IPC1-7):H01L29/70 主分类号 H01L29/70
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