发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE: To provide a semiconductor device in which a leakage voltage is high in a standby state, leakage current is reduce, a threshold voltage is more reduced in an active state and a high-speed operation is enabled by a low power supply voltage. CONSTITUTION: In a CMOS circuit 100, a Vcc level is supplied to the substrate of a PMOS 101 and a Vss level is supplied to the substrate of an NMOS 103 in the standby state. Then, the condition of Vbs(PMOS)=Vbs(NMOS)=0V is established. In the active state, Veq1 and Veq2 are respectively supplied to the substrate of the PMOS 101 and the substrate of the NMOS 103 at a p-n joint part between the sources and substrates so that the conditions of -Vbs(PMOS)=Vcc-Veq1<≠build and Vps(NMOS)=Veq2-Vss<≠Build can be established, and the threshold voltage is reduced rather than that in the standby state. At such a time, the leakage current caused by forward bias loaded to the p-n joint part is extremely small and ignored.
申请公布号 JPH098645(A) 申请公布日期 1997.01.10
申请号 JP19950150362 申请日期 1995.06.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAUCHI TADAAKI;ARIMOTO KAZUTAMI
分类号 H01L21/822;G11C11/408;H01L21/8238;H01L27/02;H01L27/04;H01L27/092;H03K19/0175;H03K19/094;H03K19/0948;(IPC1-7):H03K19/094;H01L21/823;H03K19/017 主分类号 H01L21/822
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