发明名称 X=ray imaging system with amorphous silicon detector - with the detector surface divided into areas of varying resoltuion by electronically combining pixels into small or large groups
摘要 <p>An X-ray imaging system with a amorphous silicon (Si:H) detector matrix. The detector comprises a number of sub-detectors (A-D), each of which has different resolution. The sub-detectors form part of the whole unit and are associated with a scintillator of constant resolution. The pixel concentration (A-D) for each sub-detector is equal and their varying resolution is obtained by use of parallel switching of neighbouring pixel columns and rows. A higher resolution scintillator (4) is associated with one sub-detector (B) and its resolution is matched to the scintillator. The high resolution sub-detector (B) can be operated with high or low frequency. An alternative system involves the overlaying of a second detector (higher) resolution to the first detector. The surface of the second detector is smaller than thant of the first detector. Different numbers of sub-detectors are possible, typically nine each with different areas of pixel concentration. Electronic means for surpressing aliasing are provided.</p>
申请公布号 DE19524858(A1) 申请公布日期 1997.01.09
申请号 DE1995124858 申请日期 1995.07.07
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 HASSLER, DIETRICH, DIPL.-ING., 91080 UTTENREUTH, DE;HOHEISEL, MARTIN, DR.RER.NAT., 91054 ERLANGEN, DE;SCHULZ, REINER, DR.RER.NAT., 91077 DORMITZ, DE
分类号 G01N23/04;G01T1/24;H04N5/32;H04N5/335;(IPC1-7):G01T1/24;G01T1/29;G01T1/20;A61B6/00;H04N5/321;G03B42/02 主分类号 G01N23/04
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