发明名称 Bit error measuring instrument
摘要 <p>A pattern generating means, a multiplexing means, and a pattern position specifying-recording means of a testing device used for testing bit errors. An M-channel pattern generator and a pattern generation control section (10) which allows the pattern generator to output a pattern while successively switching the generating section of each channel and when a certain channel is selected to output a pattern, controls the pattern generating operations of the ondly, a clock frequency difference detecting section (150) which measures the frequency of an input clock (111), detects a frequency change that exceeds a prescribed frequency difference by comparing the measured frequency with the frequency value meajudges whether or not measurement is being conducted, and controls the permission/inhibition of the phase inverting operation of a clock switching circuit (128) is provided. Thirdly, a pattern position recording section (210) which stores the information about the reference pattern generating position of a reference pattern generator (262) in a recording memory (220) when an error detecting signal (265a) from a collating device (265) is detected, is provided.</p>
申请公布号 GB2302191(A) 申请公布日期 1997.01.08
申请号 GB19960022117 申请日期 1996.02.22
申请人 * ADVANTEST CORPORATION 发明人 TETSUO * SOTOME;TAKAYUKI * NAKAJIMA;KAZUTAKA * OSAWA;KAZUHIRO * SHIMAWAKI;KOUICHI * SHIROYAMA
分类号 G01R31/3181;G01R31/319;G06F1/12;G06F11/24;G06F11/273;G06F11/277;H04L1/24;(IPC1-7):G01R31/318;G01R31/317 主分类号 G01R31/3181
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