发明名称 Integrated circuit BiMOS fabrication method
摘要 The method for manufacturing an IC consists in covering a monocrystalline silicon substrate (1) with an oxide layer and delimiting two buried n type regions. The two regions are defined by a masking operation. Arsenic ions are then implanted in the substrate areas revealed by an etching operation (20). An annealing treatment is then applied to the substrate. A second masking operation covers the implanted areas which are associated with a NMOS component and a vertical PNP component. A high dose ion implantation is applied to the substrate in order to define N - and N+ regions.
申请公布号 FR2736208(A1) 申请公布日期 1997.01.03
申请号 FR19950007904 申请日期 1995.06.30
申请人 MOTOROLA SEMICONDUCTEURS SA 发明人 FOERSTNER JUERGEN;COMBES MYRIAM;MARTY BLAVIER ARLETTE;HAUTEKIET GUY
分类号 H01L21/74;H01L21/8249 主分类号 H01L21/74
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