发明名称 |
Lithographic photomask production apparatus for LSI semiconductor manufacture |
摘要 |
The apparatus (30) includes a grid data producing device (32), a grid-data memory circuit (33), a correction processing device (34), and an output controller (35). The data producing device, e.g. four parallel processing MPUs, receives data corresponding to a photomask to produce grid data which will be used in the production of a photomask pattern by a pattern irradiation device (10). The grid data is stored in the grid-data memory, data stored there being corrected by the correction device, e.g. four further parallel processing MPUs, before being sent to the pattern irradiation device. The correction is carried out so that photomask carries a desired resist pattern which is exposed by irradiation light through a photomask so that the produced photomask pattern is transferred via the resist, after which the resist is developed. |
申请公布号 |
DE19625894(A1) |
申请公布日期 |
1997.01.02 |
申请号 |
DE1996125894 |
申请日期 |
1996.06.27 |
申请人 |
SONY CORP., TOKIO/TOKYO, JP |
发明人 |
KAWAHIRA, HIROCHI, TOKIO/TOKYO, JP |
分类号 |
G03F1/36;G03F1/68;G03F7/20;H01J37/302;H01L21/027 |
主分类号 |
G03F1/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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