发明名称 |
Field-testable integrated circuit and method of testing |
摘要 |
A field-testable integrated circuit that includes a plurality of analog signal channels for receiving a respective analog signal during a normal mode of operation is provided. Individual test circuits are built-in within the integrated circuit for selecting respective ones of the plurality of channels to receive predetermined reference signals during a test mode of operation while uninterruptedly providing the normal mode of operation in any remaining unselected channels. Each test circuit includes a channel decoder responsive to predetermined channel select signals for producing a respective channel decoder output signal. A multiplexer is responsive to predetermined reference select signals and to the decoder output signal for supplying during the test mode of operation a selected one of the predetermined reference signals to the respective analog channel being coupled to the individual test circuit therein. A switching gate is responsive to the respective channel decoder output signal so that during the normal mode of operation the switching gate is in a respective conducting state for allowing the respective analog signal to pass therethrough while during the test mode of operation the switching gate is in a respective nonconductive state for interrupting the respective analog signal from passing therethrough.
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申请公布号 |
US5589766(A) |
申请公布日期 |
1996.12.31 |
申请号 |
US19950417576 |
申请日期 |
1995.04.06 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
FRANK, PAUL A.;MCGRATH, DONALD T.;STAVER, DANIEL A. |
分类号 |
G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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