| 摘要 |
It is an object of the present invention to provide an x-ray diffractometer for measuring an x-ray diffraction pattern obtained by irradiating x-rays 6 to a sample 7, in which, even though irradiation/non-irradiation of x-rays 6 to the sample 7 are repeated, a target in an x-ray tube bulb 1 is not contaminated and a filament 3 is not thermally stressed, thus improving the practical lifetime of the x-ray tube bulb 1. To achieve this object, the x-ray diffractometer of the present invention is arranged such that x-ray irradiation/non-irradiation selecting means 17 is arranged to switch states of supply and non-supply of a tube voltage to the x-ray tube bulb 1, and that an x-ray generating power source device 11 comprises filament preliminary heating current supply means 16 for letting flow a preset current in the filament 3 of the x-ray tube bulb 1 in the state where a tube voltage is not supplied. According to the arrangement above-mentioned, in the x-ray non-irradiation state, each of the tube voltage and current of the x-ray tube bulb 1 becomes zero, and the filament 3 is brought to a preliminarily heated state. |
