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发明名称
TEST PROBE
摘要
申请公布号
JPH08338852(A)
申请公布日期
1996.12.24
申请号
JP19950146227
申请日期
1995.06.13
申请人
SONY CORP
发明人
NAKAYABU TOMOYASU
分类号
G01R1/067;G01R1/073;G01R31/02;G01R31/28;(IPC1-7):G01R1/067
主分类号
G01R1/067
代理机构
代理人
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地址
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