发明名称 CHEMICAL MECHANICAL POLISHING PAD WHICH IMPARTS UNIFORMITY
摘要 PROBLEM TO BE SOLVED: To uniformly polish by arranging conduits in a support matrix so that the center of a longitudinal axis of the conduit and the working surface of a polishing pad form a desired angle. SOLUTION: An angle between the longitudinal centerline 222 of a cylindrical tube 210 and the working surface 216 of a polishing pad 200 is set into a range of about 60 deg. to about 120 deg.. The charging density of the cylindrical tubes 210 in the polishing pad 200 is adjusted to provide liquid flow volume to the pad surface and to provide the desired quantity of void space for treating slurry or reactive etchant material, and the total polishing degree desirable for the polishing pad 200 is provided depending on the relative hardness of the cylindrical tube 210 to the hardness of a surrounding support matrix 220.
申请公布号 JPH08336752(A) 申请公布日期 1996.12.24
申请号 JP19960086710 申请日期 1996.04.09
申请人 APPLIED MATERIALS INC 发明人 SHIYAMOUIRU SHIYAMOUIRIAN;DANIERU OO KURAAKU
分类号 B24B37/26 主分类号 B24B37/26
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