发明名称 METHOD FOR MAKING ISOLATION REGIONS BETWEEN SEMICONDUCTOR COMPONENTS
摘要 forming the first oxide film(2), the first polysilicon(3) and a nitride film(4) on a silicon substrate(1) to remove the nitride film(4) and the first polysilicon(3) on a field region selectively by defining an active region and the field region; forming the second polysilicon side wall(8) on the side wall of the second oxide film(6) by an etch-back of the second oxide film(6) and the second polysilicon(7); removing the second oxide film to form the third polysilicon(9); forming the forth polysilicon(10) after etching the second oxide film; and forming a field oxide film(11) by a thermal process in O2 atmosphere.
申请公布号 KR960016770(B1) 申请公布日期 1996.12.20
申请号 KR19940005334 申请日期 1994.03.17
申请人 LG SEMICONDUCTOR CO.,LTD. 发明人 PARK, BYUNG-JOO;YU, JAE-MIN
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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