发明名称 |
METHOD FOR MAKING ISOLATION REGIONS BETWEEN SEMICONDUCTOR COMPONENTS |
摘要 |
forming the first oxide film(2), the first polysilicon(3) and a nitride film(4) on a silicon substrate(1) to remove the nitride film(4) and the first polysilicon(3) on a field region selectively by defining an active region and the field region; forming the second polysilicon side wall(8) on the side wall of the second oxide film(6) by an etch-back of the second oxide film(6) and the second polysilicon(7); removing the second oxide film to form the third polysilicon(9); forming the forth polysilicon(10) after etching the second oxide film; and forming a field oxide film(11) by a thermal process in O2 atmosphere.
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申请公布号 |
KR960016770(B1) |
申请公布日期 |
1996.12.20 |
申请号 |
KR19940005334 |
申请日期 |
1994.03.17 |
申请人 |
LG SEMICONDUCTOR CO.,LTD. |
发明人 |
PARK, BYUNG-JOO;YU, JAE-MIN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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