Pulse rate generation circuit for semiconductor testing system

摘要

The circuit has a pattern generator holding pulse rate data relating to the spacing between the the pulses of the test signal for the semiconductor testing system. Several sets of pulse rate data are read out in parallel in synchronism with the system clock and held in a temporary memory for transfer to a clock generator (31), providing corresponding time pulse and time data element sets. Parallel sets of time pulse and time data elements are received by a waveform generator, providing a serial output signal.