| 摘要 |
An x-ray detector for an automatic exposure control system has a substrate of carbon composite material with a first layer of conductive material on a major surface of the substrate. A second layer of homogeneous semiconductive material, such as CdTe, CdZnTe or amorphous silicon, is deposited on the first layer and has an electrical characteristic, such as conductivity, that varies in response to impingement of x-rays. A third layer of conductive material is formed on the surface of the semiconductor layer and is divided into a plurality of electrode elements which define a plurality of regions in the layer of semiconductive material. By sensing the conductivity between the first layer and each of the electrode elements, the intensity of x-rays striking the different regions can be measured.
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