发明名称 Non-contact thickness measurement using UTG
摘要 A measurement structure for determining the thickness of a specimen without mechanical contact but instead employing ultrasonic waves including an ultrasonic transducer and an ultrasonic delay line connected to the transducer by a retainer or collar. The specimen, whose thickness is to be measured, is positioned below the delay line. On the upper surface of the specimen a medium such as a drop of water is disposed which functions to couple the ultrasonic waves from the delay line to the specimen. A receiver device, which may be an ultrasonic thickness gauge, receives reflected ultrasonic waves reflected from the upper and lower surface of the specimen and determines the thickness of the specimen based on the time spacing of the reflected waves.
申请公布号 US5585563(A) 申请公布日期 1996.12.17
申请号 US19930094664 申请日期 1993.07.08
申请人 BUI, HOA T. 发明人 BUI, HOA T.
分类号 G01B17/02;G01N29/07;(IPC1-7):G01N29/10;G01N29/22 主分类号 G01B17/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利