摘要 |
<p>PURPOSE: To surely perform the crosstalk test of plural D/A conversion parts without requiring preparation of a test data generation part on the outside with respect to the circuit device incorporating plural D/A conversion parts. CONSTITUTION: Plural D/A conversion parts 56, 64, and 65 including the D/A conversion part for D/A conversion of output data obtained from multiplication parts 58 and 60 which use the digital data from a sine wave data ROM 62 and a cosine wave data ROM 63 to process the digital color difference signal data, an all high data supply part 71 which supplies specific digital data for test to one of D/A conversion parts 56, 64, and 65 at the time of the crosstalk test of D/A conversion parts 56, 64, and 65, and a sine wave signal data supply part 72 which reads out digital sine wave signal data from the sine wave data ROM 62 to supply it to another of D/A conversion parts 56, 64, and 65 as data for test are provided.</p> |