发明名称 |
CHEMICAL AMPLIFICATION POSITIVE TYPE RESIST MATERIAL |
摘要 |
PURPOSE: To obtain a resist material having high sensitivity to high energy beams such as far UV, electron beams or X-rays, capable of forming a pattern by development with an aq. alkali soln. and fit to microfabrication technique. CONSTITUTION: This resist material contains polysiloxane (A) having terminal silanol groups each protected with a trimethylsilyl group and represented by the formula and an acid generating agent (B). |
申请公布号 |
JPH08334900(A) |
申请公布日期 |
1996.12.17 |
申请号 |
JP19960094845 |
申请日期 |
1996.03.25 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
TAKEMURA KATSUYA;TSUCHIYA JUNJI;ISHIHARA TOSHINOBU |
分类号 |
G03F7/004;G03F7/039;G03F7/075;H01L21/027;(IPC1-7):G03F7/039 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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