发明名称 CHEMICAL AMPLIFICATION POSITIVE TYPE RESIST MATERIAL
摘要 PURPOSE: To obtain a resist material having high sensitivity to high energy beams such as far UV, electron beams or X-rays, capable of forming a pattern by development with an aq. alkali soln. and fit to microfabrication technique. CONSTITUTION: This resist material contains polysiloxane (A) having terminal silanol groups each protected with a trimethylsilyl group and represented by the formula and an acid generating agent (B).
申请公布号 JPH08334900(A) 申请公布日期 1996.12.17
申请号 JP19960094845 申请日期 1996.03.25
申请人 SHIN ETSU CHEM CO LTD 发明人 TAKEMURA KATSUYA;TSUCHIYA JUNJI;ISHIHARA TOSHINOBU
分类号 G03F7/004;G03F7/039;G03F7/075;H01L21/027;(IPC1-7):G03F7/039 主分类号 G03F7/004
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