| 摘要 |
Optoelectronic method for the dimensional testing of a prism (2) with the cross-section of a parallelogram, moving on a conveyor (1), which method includes the following steps: a) two non-parallel faces of the said prism are lined up along directions (OY, OZ) which are perpendicular to each other and, at a given instant, the two angular measurements ( alpha , beta ) relating to the positions of the three edges delimiting these two faces are obtained, b) the position of the edge common to these two faces is estimated with respect to one or other of the said directions (OY, OZ), c) the exact position of the common edge is determined according to the two directions (OY, OZ) by iterations starting from the previous estimation and the previous two angular measurements ( alpha , beta ). <IMAGE> |
