发明名称 Process for forming a capacitor having a metal-oxide dielectric
摘要 A capacitor with a metal-oxide dielectric layer is formed with an upper electrode layer that is electrically connected to an underlying circuit element. The capacitor may be used in forming storage capacitors for DRAM and NVRAM cells. After forming an underlying circuit element, such as a source/drain region of a transistor, a metal-oxide capacitor is formed over the circuit element. An opening is formed through the capacitor and extends to the circuit element. An insulating spacer is formed, and a conductive member is formed that electrically connects the circuit element to the upper electrode layer of the metal-oxide capacitor. Devices including DRAM and NVRAM cells and methods of forming them are disclosed.
申请公布号 US5583068(A) 申请公布日期 1996.12.10
申请号 US19950430680 申请日期 1995.04.28
申请人 MOTOROLA, INC. 发明人 JONES, JR., ROBERT E.;MANIAR, PAPU D.;CAMPBELL, ANDREW C.;MOAZZAMI, REZA
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;H01L29/92;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L27/04
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