发明名称 |
Semiconductor device and process for formation thereof |
摘要 |
A recess is formed (dug) into the surface of a substrate to form a gate channel in the recess, so that a monocrystalline source/drain region can be formed at a level higher than that of the channel. The process includes the steps of: (a) forming an insulating layer and an oxidation preventing layer on a semiconductor substrate, and removing the oxidation preventing layer of a channel region of the transistor by an etching process; (b) forming an oxide layer on the channel region of the transistor by thermally oxidizing the semiconductor substrate, removing the oxidation preventing layer, and carrying out a first ion implantation on the whole surface; (c) removing the oxide layer, and forming the channel of the transistor in the form of a recess so as for the recess to be positioned lower than the surface of the substrate; (d) forming a gate electrode in the recess; and (e) carrying out a second ion implantation on the whole surface, and carrying out a heat treatment to form a source/drain region.
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申请公布号 |
US5583064(A) |
申请公布日期 |
1996.12.10 |
申请号 |
US19950376517 |
申请日期 |
1995.01.23 |
申请人 |
GOLDSTAR ELECTRON CO. LTD. |
发明人 |
LEE, CHANG-JAE;KWON, HYUK-JIN |
分类号 |
H01L29/78;H01L21/336;(IPC1-7):H01L21/265;H01L21/302;H01L21/304;H01L21/76 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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