发明名称 Method of fabricating nonvolatile semiconductor memory element having elevated source and drain regions
摘要 This invention relates to a nonvolatile semiconductor memory element having elevated source and drain regions, a well-shaped floating gate surrounding a control gate, and leveled surface, and a method for fabricating the same. The nonvolatile semiconductor memory element includes a first conduction type substrate having a channel region, an elevated source and drain regions of second conduction type formed to have a step on the substrate separated by the channel region, a floating gate insulation film formed on exposed surfaces of the substrate corresponding to the channel region and the source and drain regions, as well-shaped floating gate formed on the floating gate insulation film on the channel region having a fixed depth and a fixed thickness, a control gate having a fixed thickness formed fully buried in the well of the floating gate so that the floating gate can surround the control gate, and an interlayer insulation film formed between the floating gate and the control gate so as to insulate the floating gate and the control gate.
申请公布号 US5583066(A) 申请公布日期 1996.12.10
申请号 US19950418283 申请日期 1995.04.07
申请人 LG SEMICON CO., LTD. 发明人 JUNG, WON Y.
分类号 H01L27/10;H01L21/8247;H01L27/115;(IPC1-7):H01L21/824 主分类号 H01L27/10
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