发明名称 Self-aligned FET having etched ohmic contacts
摘要 A III-V semiconductor FET (10, 30, 40) having etched ohmic contacts (19, 20, 36, 37, 43, 44). A gate (16) of the FET (10, 30, 40) is formed in contact with a surface of a III-V substrate (11). An ohmic contact (19, 20, 36, 37, 43, 44) is created to include an alloy in contact with the surface of the substrate (11). The ohmic contact (19, 20, 36, 37, 43, 44) is formed to abut the gate structure (16, 17, 18) by covering a portion of the gate structure (16, 17, 18) and the substrate (11) with the ohmic contact (19, 20, 36, 37, 43, 44), then, removing portions of the ohmic contact from the gate structure (16, 17, 18) by etching. The ohmic contact (19, 20, 36, 37, 43, 44) is formed to be substantially devoid of gold.
申请公布号 US5583355(A) 申请公布日期 1996.12.10
申请号 US19950571632 申请日期 1995.12.13
申请人 MOTOROLA, INC. 发明人 BERNHARDT, BRUCE A.;CHO, JAESHIN;HANSELL, GREGORY L.;WU, SCHYI-YI
分类号 H01L21/285;H01L21/338;H01L29/45;H01L29/812;(IPC1-7):H01L31/032;H01L29/80;H01L27/088;H01L23/48 主分类号 H01L21/285
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