发明名称 |
Method for producing a semiconductor device with a particular source/drain and gate structure |
摘要 |
There is provided a semiconductor device with very small functional elements, which can be constructed by necessary minimum components without any unnecessary surface area, thus being capable of significantly reducing the layout area and adapted for achieving a fine geometry and a high level of integration. The semiconductor device is provided with a first semiconductor area of a first conductive type (for example a p- well) and a second semiconductor area formed on or under the first semiconductor area and having a second conductive type different from the first conductive type (for example a source or drain area), in which an electrode electrically connected to the first semiconductor area is formed through the second semiconductor area, and the first and second semiconductor areas are shortcircuited by the above-mentioned electrode.
|
申请公布号 |
US5583075(A) |
申请公布日期 |
1996.12.10 |
申请号 |
US19940352050 |
申请日期 |
1994.12.05 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
OHZU, HAYAO;KOCHI, TETSUNOBU |
分类号 |
H01L21/285;H01L21/28;H01L21/336;H01L21/74;H01L21/8238;H01L27/092;H01L29/41;H01L29/78;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/285 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|