发明名称 METHOD FOR MEASURING OF CHARACTERISTICS OF R, L AND C CIRCUITS
摘要 FIELD: instruments which measure non-electric characteristics by means of capacitance, inductance or resistor detectors. SUBSTANCE: method involves effecting tested circuit with driving voltage or current which alternation function has at least one pair of identical pieces, each of which has two linear driving pieces; generating reference signal which corresponds to pair and which alternation function has linear reference pieces, each of which is determined for corresponding linear measuring piece of pair; comparison of signal of response to driving stimulus for first and second driving pieces of pair against reference voltage; generating time interval between moments when said signals are equal; comparison of said signals for time intervals of third and fourth linear measuring pieces of pair; generating second time interval when signals to be compared are equal; calculation of difference between generated time intervals or their equivalents, which are expressed as another physical parameter and are calculated by means of linear uniform conversion of intervals. Said difference is used for calculation of parameter to be measured. EFFECT: increased precision due to decreased error which is caused by instability of temporal delay in signal transmission. 3 cl, 3 dwg
申请公布号 RU95104390(A) 申请公布日期 1996.12.10
申请号 RU19950104390 申请日期 1995.03.24
申请人 KULIKOV N.D. 发明人 KULIKOV N.D.
分类号 G01R27/26;G01R27/02 主分类号 G01R27/26
代理机构 代理人
主权项
地址