发明名称 |
APARATO PARA CARACTERIZAR PELICULAS DELGADAS SUPERCONDUCTORAS A ALTA TEMPERATURA. |
摘要 |
A dielectric resonator apparatus for measuring the parameters of high temperature superconducting thin film is disclosed having improved means for positioning the dielectric and substrates, holding the resonator components in place during use, suppressing undesirable modes, adjusting the magnetic dipole coupling, and coupling to an electrical circuit.
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申请公布号 |
ES2092836(T3) |
申请公布日期 |
1996.12.01 |
申请号 |
ES19930920053T |
申请日期 |
1993.08.18 |
申请人 |
E.I. DU PONT DE NEMOURS AND COMPANY |
发明人 |
DOROTHY, ROBERT, GLENN;NGUYEN, VIET, XUAN;SHEN, ZHI-YUAN |
分类号 |
G01R27/26;H01P7/10;(IPC1-7):G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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