发明名称 TEST ITEM GENERATOR
摘要 PURPOSE: To generate a test item corresponding to test technique and to reduce the labor for generation of the test item by inputting test technique name and generating the test item from the test technique. CONSTITUTION: Test technique name is inputted from a test technique name input means 101. Specification description in which the specification of a system is described in a form style is inputted from a specification description input means 102. Then, a test technique applying means 103 applies the test technique to the specification description inputted by the specification description input means 102 based on the test technique name inputted by the test technique name input means 101. Consequently, a generated test item is outputted from a test item output means 104. In such a way, the test item is generated replying to the test technique by inputting the test technique name.
申请公布号 JPH08314747(A) 申请公布日期 1996.11.29
申请号 JP19950118723 申请日期 1995.05.17
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 UENO TAKESHI;TATENO MINEO;TERASAKI SATOSHI
分类号 G06F11/22 主分类号 G06F11/22
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