| 摘要 |
PURPOSE: To perform a test efficiently in a short time using a small number of patterns. CONSTITUTION: A random test pattern generator 11 comprises a memory 13, a program counter control section 14, an execution circuit 15, and registers 16, 17. An algorithmic pattern generator 20 comprises an operating circuit 21, an initial value register 24, and an ALU variation value register 23. The algorithmic pattern generator 20 further comprises means for outputting the operation results from the operating circuit 21 based on a set pulse generated from the execution circuit 15 upon receiving a test pattern delivery instruction from the memory 13. A multiplexer 19 transfers a test pattern from the algorithmic pattern generator 20 to the register 16 while switching from a test pattern read out from the memory 13. |
