发明名称 Method for the preparation of a pattern overlay accuracy-measuring mark
摘要 A method for the preparation of a pattern overlay accuracy-measuring mark, consisting of an inner box and an outer box. The method creates a groove along the inside boundary line of the outer box so as to form an enlarged step. The enlarged step prevents inaccuracy in defining the boundary line of the outer box whose inaccuracy is mainly attributed to reflow which occurs at the boundary line as a metal layer is later coated over the outer box. The method can easily define the boundary line and thus more define the overlay accuracy.
申请公布号 US5578423(A) 申请公布日期 1996.11.26
申请号 US19940321448 申请日期 1994.10.12
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 BAE, SANG M.
分类号 H01L21/66;G03F7/20;G03F9/00;H01L21/027;H01L23/544;(IPC1-7):G03C5/00;G03F7/36 主分类号 H01L21/66
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