| 发明名称 |
REFLECTION TYPE ELECTRON DIFFRACTING DEVICE |
| 摘要 |
PURPOSE:To readily perform the intensity measurement of diffracted rays with a reflection type electron diffracting device by chopping a primary electron beam or diffracted electron beam. |
| 申请公布号 |
JPS5358284(A) |
申请公布日期 |
1978.05.26 |
| 申请号 |
JP19760133198 |
申请日期 |
1976.11.08 |
| 申请人 |
HITACHI LTD |
发明人 |
HAYAKAWA KAZUNOBU |
| 分类号 |
G01N23/207;G01N23/20;G01N23/225;H01J37/295 |
主分类号 |
G01N23/207 |
| 代理机构 |
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代理人 |
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| 地址 |
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