MEASURING ARRANGEMENT FOR MEASURING CURVATURE OF SURFACE OF THIN-WALLED ANISOTROPIC SHELL

摘要

Invention applies to the material testing and measurement of thin structures and may be used for design and manufacture of goods (garments, foot-wear), construction structures (hangars) and flying apparatus (balloons, etc.). It essentially expands the functional possibilities of the measuring instruments used to measure the thin wall anisotropic shell surface curvature as the instrument creates conditions to measure both the positive and negative curvature surfaces. The instrument consists of a sample (6) pressure device (1), sample load device (2) and a sample bending measuring device (3). The latter is placed under the sample (6) and is made of vertical two pin branches (14), symmetrically touching the sample (6) and a micrometer (15), all being mounted on a disk (16) with a turning angle position fastener (28), and vertically moving frame (18) where there is screw installed (19). The screw has opposite direction treads on its ends and holds the branch (14) pins (24, 25) with two sliders (22, 23). The screw can also change the distance between the pins.