发明名称 SEMICONDUCTOR THIN FILM STRUCTURE SURFACE ACOUSTIC WAVE FUNCTION ELEMENT AND ELECTRONIC DEVICE
摘要 PURPOSE: To obtain the function element conducting a valid interaction even when the film thickness is increased by arranging grating electrodes on a propagation path and properly selecting the width of the propagation path of a surface acoustic wave and the width of an interaction section of a semiconductor section. CONSTITUTION: Grating electrodes 2 whose width is narrower than a wavelengthλof a surface acoustic wave are arranged on a propagation path of the surface acoustic wave propagated on a piezoelectric substrate 1 or a substrate 1 having a piezoelectric thin film at a right angle to the propagation direction wider than a width W of the propagation path. Furthermore, a strip shaped semiconductor thin film 6 is arranged to part of the propagation path under the grating electrodes 2 or at a position at the outside of the propagation path at a right angle to the propagation path at the same width W as the propagation path or a different width (a) from the width of the propagation path.
申请公布号 JPH08307203(A) 申请公布日期 1996.11.22
申请号 JP19950149378 申请日期 1995.05.11
申请人 YAMANOUCHI KAZUHIKO 发明人 YAMANOUCHI KAZUHIKO;KUMAGAI SEIJI
分类号 H03H9/145;H03H9/25;H03H9/72;(IPC1-7):H03H9/72 主分类号 H03H9/145
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