发明名称 CANTILEVER FOR INTERATOMIC FORCE MICROSCOPE AND ITS MANUFACTURE
摘要 PURPOSE: To provide a cantilever having high resolution without impairing the self-strain detecting function by forming a self-strain quantity detecting means with a piezoelectric thin film and electrodes formed on it. CONSTITUTION: This cantilever is provided with at least a flexible plate and a self-strain quantity detecting means formed on one face of the flexible plate. The flexible plate is formed with a silicon nitride film 3 on a silicone monocrystal 2. The self-strain quantity detecting means is constituted of a piezoelectric thin film 7, an upper electrode 8 formed on the piezoelectric thin film 7, and a lower electrode formed between the piezoelectric thin film 7 and the flexible plate. The upper electrode 8, the lower electrode, and lead extraction portions 6 are formed by the deposition of platinum. When the thickness of the piezoelectric thin film 7 and the thickness of the cantilever except for the piezoelectric thin film 7 and electrode portions are set to proper values, the strain in the thickness direction can be mitigated, and the bend owing to the residual strain is reduced.
申请公布号 JPH08297129(A) 申请公布日期 1996.11.12
申请号 JP19950102719 申请日期 1995.04.26
申请人 NIKON CORP 发明人 WATANABE SHUNJI;FUJIO HISAMITSU
分类号 G01B21/30;G01B5/28;G01N23/00;G01N37/00;G01Q20/04;G01Q60/34;G01Q60/38;G01Q70/08;G01Q70/14;H01J37/28;(IPC1-7):G01N37/00 主分类号 G01B21/30
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