| 摘要 |
FIELD: computer engineering; test diagnostics of digital devices. SUBSTANCE: prohibited test sets are determined by analyzing functioning conditions of device to be tested. They are assigned digital equivalents of adopted capacity base (codes) which are entered in pseudorandom train generator prior to its triggering. Generator produces binary-digit pseudorandom train of desired length in forward or reverse sequence eliminating arrival of prohibited test sets. In this way, failure of digital device being tested is eliminated. EFFECT: enlarged functional capabilities due to eliminating test sets across its outputs prohibited for particular tested device. 2 dwg |
