发明名称 SELF-ALIGNED CONTACT TRENCH DMOS TRANSISTOR STRUCTURE AND METHODS OF FABRICATING SAME
摘要 <p>A trench DMOS transistor structure includes a contact to the transistor's source and body that is self-aligned to the trench. With a self-aligned contact, the distance from the edge of the source and body contact to the edge of the trench can be minimized. Thus, the distance between the trench edges can be reduced. As a result, the packing density of the transistor is increased dramatically. This gives rise to much improved performance in terms of low m-resistance and higher current drive capability. Alternate process modules are provided for fabricating the self-aligned contact structure.</p>
申请公布号 WO1996035231(A1) 申请公布日期 1996.11.07
申请号 US1996006140 申请日期 1996.05.01
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