Method and system for testing an integrated circuit featuring scan design,申请号EP19920114431-传众专利搜索

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发明名称	Method and system for testing an integrated circuit featuring scan design
摘要
申请公布号	EP0584385(B1)	申请公布日期	1996.11.06
申请号	EP19920114431	申请日期	1992.08.25
申请人	INTERNATIONAL BUSINESS MACHINES CORPORATION	发明人	DIEBOLD, ULRICH;ROST, PETER;SCHMIDT, MANFRED;TORREITER, OTTO;VOGT, ROLF;WAGNER-DREBENSTEDT, KLAUS
分类号	G01R31/3183;G01R31/3185;(IPC1-7):G06F11/26	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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