| 摘要 |
A test jig for probing single or double sided printed circuit boards ("PCB") containing targets statically retains the PCB in stable registration against a nest plate statically affixed to a main frame. A top frame with hinged cover, and a bottom frame are disposed above and below the main frame. Statically attached to the top cover is a top bed of nails and a clamp plate with through holes corresponding to targets on the PCB upperside. The bottom frame has statically attached thereto a bottom bed of nails whose probes can protrude through nest plate openings corresponding to targets on the PCB underside. The PCB is held statically and in registered alignment with the nest plate and during jig actuation, the top and bottom frames are moved vertically toward the PCB. Parallel aligned movement of these frames during actuation is ensured by mating alignment of main frame protruding guide rods and matching bushings affixed to the top and bottom frames. Registration between the top bed of nails, the nest plate and the bottom bed of nails is achieved by providing master tooling holes in these components (as well as the clamp plate). During setup, master tooling rods are passed through these holes, and the respective components are statically attached to the relevant frame. Because parallel movement of the top and bottom bed of nails relative to the statically retained PCB occurs, waffling, sideloading and test probe damage are minimized, and the test probes make reliable contact with the intended PCB target.
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