发明名称 |
Insulated-gate bipolar transistor with reduced latch-up |
摘要 |
An insulated-gate bipolar transistor includes a semiconductor region of a first conductive type; a base layer of a second conductive type diffused from a surface of the semiconductor region; a source layer of the first conductive type diffused in a surface portion of the base layer; an insulated gate buried in a recess dug from the surface of the source layer through the base layer up to the semiconductor region; a collector layer of the second conductive type diffused from a surface of the semiconductor region on an opposite side of the insulated gate with respect to the source layer; an emitter terminal drawn from the base layer and the source layer; a collector terminal drawn from the collector layer; and a gate terminal drawn from the insulated gate.
|
申请公布号 |
US5572055(A) |
申请公布日期 |
1996.11.05 |
申请号 |
US19950491517 |
申请日期 |
1995.06.19 |
申请人 |
FUJI ELECTRIC CO., LTD. |
发明人 |
SUMIDA, HITOSHI |
分类号 |
H01L21/331;H01L29/06;H01L29/739;(IPC1-7):H01L29/76;H01L29/74;H01L29/94 |
主分类号 |
H01L21/331 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|