发明名称 Insulated-gate bipolar transistor with reduced latch-up
摘要 An insulated-gate bipolar transistor includes a semiconductor region of a first conductive type; a base layer of a second conductive type diffused from a surface of the semiconductor region; a source layer of the first conductive type diffused in a surface portion of the base layer; an insulated gate buried in a recess dug from the surface of the source layer through the base layer up to the semiconductor region; a collector layer of the second conductive type diffused from a surface of the semiconductor region on an opposite side of the insulated gate with respect to the source layer; an emitter terminal drawn from the base layer and the source layer; a collector terminal drawn from the collector layer; and a gate terminal drawn from the insulated gate.
申请公布号 US5572055(A) 申请公布日期 1996.11.05
申请号 US19950491517 申请日期 1995.06.19
申请人 FUJI ELECTRIC CO., LTD. 发明人 SUMIDA, HITOSHI
分类号 H01L21/331;H01L29/06;H01L29/739;(IPC1-7):H01L29/76;H01L29/74;H01L29/94 主分类号 H01L21/331
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