发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR THIN FILM AND PLASMA CVD APPARATUS USING THE METHOD
摘要 PURPOSE: To form a semiconductor thin film at high speed while the generation of a polysilane powder is being suppressed by a method wherein the deposition rate of the semiconductor thin film is set at a specific value or higher and plasma generation energy is supplied intermittently for the supply time at a specific value or lower. CONSTITUTION: Low-frequency electric power from a power supply 4, for modulation, which repeats an ON-OFF operation at a constant period in terms of a direct current is overlapped with high-frequency electric power from a high-frequency power supply. Then, the deposition rate of a semiconductor thin film is set at 600Å/min or higher, and plasma generation energy is supplied intermittently for a supply time of 500μsec or lower. In this manner, the plasma generation energy is supplied intermittently for the supply time at the time or lower of the inverse number of [(secondary reaction rate constant of mother gas reacting with activated species other than long-life activated species at inside of plasma) × (number of mother gas molecules)]. Thereby, the thin film can be formed at high speed.
申请公布号 JPH08288228(A) 申请公布日期 1996.11.01
申请号 JP19950339696 申请日期 1995.12.26
申请人 SHARP CORP 发明人 TOMITA KOJI;NOMOTO KATSUHIKO;SANNOMIYA HITOSHI;YAMAMOTO YOSHIHIRO;TAKAGI SAE
分类号 H05H1/46;C23C16/50;H01L21/205;H01L31/04 主分类号 H05H1/46
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