发明名称 TEST DIAGNOSTIC SYSTEM
摘要 <p>PURPOSE: To discriminate each test state and result at a glance by storing data displayed on a window corresponding to each test task and selecting a displayed pattern so as not to limit number of simultaneously executed test programs. CONSTITUTION: The test diagnostic system 50 tests and diagnoses the normal state of an information processing system comprising a central processing unit 11, a main storage device 12 and plural peripheral equipments. When a test task designated by the operator is started among tasks of a test task section 51, a task window generating section 52 generates a task window corresponding to the test task, a display control section 53 controls it that the plural task windows are displayed simultaneously onto a display device 31 and a display message from each test task is displayed onto a corresponding task window. Furthermore, an image data changeover section 54 stores the display data by plural image patterns and selects the displayed image according to a command operation entered by the operator by using a key board 32.</p>
申请公布号 JPH08286880(A) 申请公布日期 1996.11.01
申请号 JP19950108225 申请日期 1995.04.07
申请人 NEC CORP 发明人 OMOTO OSAMU
分类号 G01R31/28;G06F3/048;G06F3/14;(IPC1-7):G06F3/14 主分类号 G01R31/28
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